Extreme - ultraviolet laser metrology of O I transitions

Deep-ultraviolet quantum interference metrology with ultrashort laser pulses.

Precision spectroscopy at ultraviolet and shorter wavelengths has been hindered by the poor access of narrow-band lasers to that spectral region. We demonstrate high-accuracy quantum interference metrology on atomic transitions with the use of an amplified train of phase-controlled pulses from a femtosecond frequency comb laser. The peak power of these pulses allows for efficient harmonic upcon...

Laser triggered Z-pinch broadband extreme ultraviolet source for metrology

Analysis of Frequency Leakage in Different Optical Paths of Nano-Metrology Systems Based on Frequency-Path Models

The drawing of frequency-path (F-P) models of optical beams is an approach for nonlinearity analysis in nano-metrology systems and sensors based on the laser interferometers. In this paper, the frequency-path models of four nano-metrology laser interferometry systems are designed, analyzed and simulated, including ...

Femtosecond-pulse-driven electron-excited extreme-ultraviolet lasers in Be-like ions.

A suggestion for the generation of extreme-ultraviolet (XUV) laser radiation based on tunneling ionization and subsequent electron excitation of Deltan not equal 0 transitions is described. The favorable scaling of the required intensity of the pump laser with the output XUV wavelength is compared with that exhibited by XUV lasers ased on Deltan = 0 transitions. Calculations for Be-like Ne pred...

Tomographic reconstruction of circularly polarized high-harmonic fields: 3D attosecond metrology

Bright, circularly polarized, extreme ultraviolet (EUV) and soft x-ray high-harmonic beams can now be produced using counter-rotating circularly polarized driving laser fields. Although the resulting circularly polarized harmonics consist of relatively simple pairs of peaks in the spectral domain, in the time domain, the field is predicted to emerge as a complex series of rotating linearly pola...